Optical System Analysis

Sequential ray tracing with wavefront and diffraction analysis MK·III

Conventions — +Z along the axis toward the image, +Y up. R > 0 when the center of curvature lies to the right of the vertex. Index and Abbe number describe the medium after each surface; n = −1 marks a mirror; K = 0 sphere, −1 paraboloid. The last surface is the image plane. Stop = the checked surface.

1System Configuration

Wavelengths

F, d, C Fraunhofer lines

Field Points

Conjugates & Focus

mm or “Infinity”

2Lens Prescription

surfradius (mm) thicknessnd Vdsemi-⌀ conic Kstop comment

3Analysis

FFT auto-grows to ≥ 2× grid (Nyquist)
ready — load a preset or enter a prescription, then run.

First-Order Properties

run the analysis…

Chromatic Focal Shift

Seidel Aberration Sums

run the analysis to draw the layout
Y–Z meridional section · marginal bundle filled, chief ray dashed

Through-Focus Spot Size

scan ±5 × depth of focus λ(F#)² · dot = best focus per field

Encircled Energy

cumulative fraction of traced rays within radius of centroid

transverse ray aberration vs normalized pupil coordinate, relative to the chief ray · tangential ε_y(p_y) and sagittal ε_x(p_x) share a vertical scale per field

optical path difference against the reference sphere through the exit-pupil center, centered on the chief-ray image point · piston removed

Zernike Decomposition (Noll, λ at reference wavelength)

ink density ∝ intensity · sampling exact: Δx = λ·F#·(grid/FFT)

Through-Focus MTF

sagittal / tangential best-focus shift vs field · λ ref
real chief-ray height vs f·tanθ (or paraxial m·h for finite conjugates)

internal consistency checks — run on every full analysis