Optical Analysis Tool - Sequential Ray Tracing v2.0

System Configuration

Wavelengths

Reference λ₀ (nm):

Analysis wavelengths:

F, d, C Fraunhofer lines

Field Points

Field type:

Field values:

Conjugates & Stop

Object distance: mm or "Infinity"

Stop surface #:

Autofocus (paraxial)

Lens Prescription

Enter surface data. The LAST surface is the image plane. Index/Abbe specify the material AFTER each surface.

Surf	Radius (mm)	Thickness	n_d	V_d	Semi-Dia	Conic K	Stop	Comment

Analysis Controls

Pupil grid: FFT size:

Ready. Load an example or enter a prescription to begin.

Paraxial & Seidel

2D Layout

Spot Diagram

Ray Fan

OPD / Wavefront

PSF

MTF

Validation

First-Order Properties & Seidel Aberrations

Run analysis to see first-order properties...

Seidel aberration coefficients will appear here...

System Layout with Ray Trace

Y-Z Meridional Section

Rays per field: Marginal rays Chief rays

Cardinal planes (F, F', P, P', N, N') Entrance/Exit pupils Object-space FOV

Spot Diagrams

Scale mode: Show Airy disk Show RMS circle

Transverse Ray Aberration (Ray Fan)

Optical Path Difference (Wavefront Error)

Display: Remove piston Remove tilt

Zernike Decomposition (Noll ordering)

Zernike coefficients will appear after analysis...

Point Spread Function (Diffraction)

Display: Dynamic range:

Modulation Transfer Function

MTF vs Spatial Frequency

MTF data will appear here...

Show: Sagittal Tangential Diff. Limit

Validation Against Known Systems

Click "Run Full Analysis" on a known system to see validation results. This tool validates against: • Thin lens formula for simple systems • Known Seidel coefficients • Diffraction-limited PSF for well-corrected systems • Paraxial ray trace consistency checks

Optical System Analysis