Optical Analysis Tool - Sequential Ray Tracing v2.0

System Configuration

Wavelengths

Reference λ₀ (nm):

Analysis wavelengths:

F, d, C Fraunhofer lines

Field Points

Field type:

Field values:

Conjugates & Stop

Object distance: mm or "Infinity"

Stop surface #:

Autofocus (paraxial)

Lens Prescription

Enter surface data. The LAST surface is the image plane. Index/Abbe specify the material AFTER each surface.

Surf	Radius (mm)	Thickness	n_d	V_d	Semi-Dia	Conic K	Stop	Comment

Analysis Controls

Pupil grid: FFT size:

Ready. Load an example or enter a prescription to begin.

Paraxial & Seidel

2D Layout

Spot Diagram

Field

Ray Fan

OPD / Wavefront

PSF

MTF

Validation

First-Order Properties & Seidel Aberrations

Run analysis to see first-order properties...

Seidel aberration coefficients will appear here...

System Layout with Ray Trace

Y-Z Meridional Section

Rays per field: Marginal rays Chief rays

Cardinal planes (F, F', P, P', N, N') Entrance/Exit pupils Object-space FOV Image-space FOV

Spot Diagrams

Scale mode: Show Airy disk Show RMS circle

Through-Focus Spot Size

Metric: Range auto-scaled to ±5 × depth of focus. Dashed = current image plane; markers = best focus per field.

Spot Size vs Defocus

Encircled Energy

Show diffraction limit Cumulative fraction of geometric rays within radius from centroid. Dashed verticals at EE50 and EE80 per field.

Encircled Energy vs Radius

Field Curvature & Distortion

Sagittal/tangential best-focus shift and chief-ray distortion plotted against paraxial field height. Computed at the reference wavelength.

Field Curvature (sagittal & tangential)

F-tan(θ) Distortion (%)

Field analysis output will appear here...

Transverse Ray Aberration (Ray Fan)

Optical Path Difference (Wavefront Error)

Display: Remove piston Remove tilt

Zernike Decomposition (Noll ordering)

Zernike coefficients will appear after analysis...

Point Spread Function (Diffraction)

Display: Dynamic range:

Modulation Transfer Function

MTF vs Spatial Frequency

MTF data will appear here...

Show: Sagittal Tangential Diff. Limit

Through-Focus MTF

Spatial frequency: Sagittal Tangential

MTF at Selected Frequency vs Defocus

Validation Against Known Systems

Click "Run Full Analysis" on a known system to see validation results. This tool validates against: • Thin lens formula for simple systems • Known Seidel coefficients • Diffraction-limited PSF for well-corrected systems • Paraxial ray trace consistency checks

Optical System Analysis